6 results
Improved Focused Ion Beam Sample Preparation Techniques for Transmission Electron Microscopy and Failure Analysis of Memristor Devices
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- Journal:
- Microscopy and Microanalysis / Volume 27 / Issue S1 / August 2021
- Published online by Cambridge University Press:
- 30 July 2021, pp. 436-437
- Print publication:
- August 2021
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Transmission Electron Microscopy of Vertically Stacked ErAs-InAs Semimetal -Quantum Dot Nanocomposite Heterostructures Grown on GaAs(001) Substrates
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1524-1525
- Print publication:
- July 2017
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In vivo formation of Ce-phosphate Nanoparticles following Intratracheal Instillation of CeCl3: Subcellular sites, Nanostructures, Precipitation Mechanisms and Nanoparticle 3D-Alignment
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1342-1343
- Print publication:
- July 2017
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Calcium co-Localization with in vivo Cerium Phosphate Nanoparticle Formation after Intratracheal Instillation Dosing with CeCl3 or CeO2 NPs
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- Journal:
- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
- Published online by Cambridge University Press:
- 04 August 2017, pp. 1344-1345
- Print publication:
- July 2017
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Novel TEM Specimen Preparation Using Multi-Source Focused Ion Beams for Real-Time Electrostatic Biasing Studies
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 176-177
- Print publication:
- July 2016
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Quantitative High-Resolution Transmission Electron Microscopy of III-V Semiconductor Interfaces by Multivariate Statistical Analysis of Exit-Plane Wave Function Images
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- Journal:
- MRS Online Proceedings Library Archive / Volume 727 / 2002
- Published online by Cambridge University Press:
- 01 February 2011, R9.1
- Print publication:
- 2002
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